Call for Papers
1999 IEEE International Symposium on New Challenges in Systems-On-Chip Testing

1999 IEEE Systems Congress
August 5-7, 1999
Chateau Laurier, Ottawa, CANADA
It is our pleasure to invite you to the International Symposium on New Challenges in Systems-On-Chip Testing in conjunction with DYCONS99 to be held in Ottawa, Canada. Ottawa is Canada's leading center for high technology research and development, is a clean, green and safe city that offers the joie de vivre and local charm of a small town while providing all the excitement of a modern, cosmopolitan center and a national capital.

The rapid integration of Integrated Circuits (IC) and the new business in Electronic Design Automation (EDA) have created new demands in terms of testing. The complexity of IC continues to increase while the time to market continues to shrink. More complexity means the ability today to integrate silicon chip systems of yesterday that were built in boards and racks. This makes testing more costly and difficult. A short time to market means that test engineers will have less time to develop efficient tests for systems that are getting more complex and consequently more difficult to test.

The aim of this session is three-fold. First, classical testing issues that have been considered by the testing community for more than three decades are highlighted. Then, new test challenges due to emerging technologies for systems on chip (SOCs) are addressed. Finally, the given talks present established methodologies and techniques that help in testing SOCs as well as promising test technologies that accommodate new technological needs.

Experts in the field of testing will address important issues in such an emerging area. The talks will be organized as follows:

  • Testing of IP cores
  • Testing of analog and mixed signal SOCs
  • Testing hardware/software systems
  • Testing of field-programmable arrays
  • Test generation for complex circuits and systems

This session is intended to a wide variety of scientists from Academia and Industry that can be interested by testing issues for nowadays complex systems.

In addition to technical presentations, panel discussions by leading authorities are planned. Please submit a maximum of 8-pages article in World Scientific format to each of the following (email preferred):

Prof. Chantal Robach or Dr. Chouki Aktouf                                           Mrs. Linda Espeut
LCIS-INPG                                                                                                    Dept. of Electrical & Computer Engineering
50, Rue Barthemely de Laffemas                                                              10 King's College Road
26902, Cedex 09, Valence, France                                                             University of Toronto
Tel: (33)4-75-75-94-00                                                                                 Toronto, Ontario, Canada M5S 3G4
Email: Chantal.Robach@inpg.fr or Chouki.Aktouf@inpg.fr                Email: espeut@control.utoronto.ca

IMPORTANT DATES

March 22, 1999         Submission of manuscript (or extended abstract)

April 10, 1999           Notification of acceptance & registration fee due

May 10, 1999           Camera ready manuscript due

 

ON-LINE INFORMATION is available at:

http://www.control.utoronto.ca/people/profs/dycons99/dycons99.html